| Topographic Characterization Of Atomic Force Microscopy (AFM) On The Growth Of Tis 03 On Si Using JSPM 4210/TM 4210BU | |
|---|---|
| Pernyataan Tanggungjawab | |
| Pengarang | Pratama, Abdi - Personal Name Susanto, Adhi - Personal Name Kusumawardani, Sri Suning - Personal Name |
| Edisi | |
| No. Panggil | SK 1711 TE-2006 R |
| ISBN/ISSN | EIS01711 |
| Subyek | |
| Klasifikasi | SK |
| Judul Seri | |
| GMD | Skripsi TE |
| Bahasa | English |
| Penerbit | Jurusan Teknik Elektro FT UGM |
| Tahun Terbit | 2005 |
| Tempat Terbit | Yogyakarta |
| Deskripsi Fisik | x + 90 hal, ill, 30 cm |
| Info Detil Spesifik | |
| Lampiran Berkas | LOADING LIST... |
| Ketersediaan | LOADING LIST... |
